Please use this identifier to cite or link to this item: http://repository.kpi.kharkov.ua/handle/KhPI-Press/4713
Title: Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
Authors: Artyukov, I. A.
Feschenko, R. M.
Vinogradov, A. V.
Bugayev, Ye. A.
Devizenko, O. Y.
Kondratenko, V. V.
Kasyanov, Yu. S.
Hatano, T.
Yamamoto, M.
Saveliev, S. V.
Keywords: soft X-ray microscopy; carbon window; X-ray multilayer mirror; laser plasma
Issue Date: 2010
Publisher: Elsevier Ltd
Citation: Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics / I. A. Artyukov [et al.] // Micron. – 2010. – Vol. 41. – p. 722-728.
Abstract: The high transparency of carbon-containing materials in the spectral region of “carbon window” (∼4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets
URI: http://repository.kpi.kharkov.ua/handle/KhPI-Press/4713
Appears in Collections:Кафедра "Фізика металів і напівпровідників"

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