Growth and Structural Characterization of Thermally Evaporated Topological Insulator Bi2Se3 Thin Films
Дата
2018
DOI
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Назва журналу
Номер ISSN
Назва тому
Видавець
NanoCOFC
Анотація
Опис
Ключові слова
thin films, structural characterization, thermally evaporated topological insulator, Bi2Se3
Бібліографічний опис
Growth and Structural Characterization of Thermally Evaporated Topological Insulator Bi2Se3 Thin Films / Rogachova E. I. [et al.] // NANO Energy 2018 : abstracts book of 5th International Conference on Nanotechnology, Nanomaterials & Thin Films for Energy Applications (18-20 july 2018, University of Aveiro, Portugal) / ed.: P. Lund, F. Marques. – Aveiro : [s. n.], 2018. – P. ENR-47.