Estimation of interlayer composition in WC/Si multilayer X-ray mirrors (MXMs) at nanometer scale - Shipkova, I. G.; Chumak, V. S.; Reshetnyak, M. V.; Devizenko, A. Y.; Pershyn, Yuriy P. (НТУ "ХПІ", 2016)
Keywords: interlayer thickness; transmission electron microscopy; TEM; diffraction methods; amorphous structure; tungsten carbide