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Документ Effect of aging on thermoelectric properties of the Bi2Te3 polycrystals and thin films(Науково-технологічний комплекс "Інститут монокристалів", 2021) Rogacheva, E. I.; Doroshenko, A. N.; Novak, K. V.; Sipatov, A. Yu.; Khramova, T. I.; Saenko, S. A.The temperature dependences (77-300 K) of the thermoelectric (TE) properties (the Seebeck coefficient S, electrical conductivity σ, Hall coefficient RH, Hall charge mobility μH>, and TE power factor P) were studied for freshly prepared and for exposed to air at room temperature during 5 years p-Bi2Te3 (60.0 at.% Te) and n-Bi2Te3 (62.8 at.% Te) polycrystals and thin films grown from them by thermal evaporation in vacuum. It was found that after aging, in the p- and n-Bi2Te3 bulk crystals and in the n-type film obtained from the n-Bi2Te3 crystal, type of conductivity is reserved but the p-type film obtained from the p-Bi2Te3 crystal, change the type of conductivity from hole to electronic. The activation energies of possible defect states were determined using the RH(T) dependences. After aging, at the temperatures close to room temperature, the p values of n-Bi2Te3 and p-Bi2Te3 polycrystals decreases by ~ 20 %, but p values of the n-type film grown from n-Bi2Te3 crystal increases by 20-30 %. In the p-type film obtained from p-Bi2Te3 polycrystal, and having changed the type of conductivity after aging, the p values exceed the p values of a film obtained from n-Bi2Te3 polycrystal by ~ 35 % at 250 K and by 25 % at 300 K, remaining at these temperatures below the p values for n-Bi2Te3 polycrystal after aging by ~ 15 %.Публікація Transport properties of the bismuth telluride thin films with different stoichiometry in the temperature range 77-300 K(Науково-технологічний комплекс "Інститут монокристалів", 2020) Rogacheva, E. I.; Novak, K. V.; Doroshenko, A. N.; Nashchekina, O. N.; Budnik, A. V.The objects of the present study are thin films with thicknesses d = 45-620 nm prepared by thermal evaporation in vacuum from a single source, using undoped p- and n-type Bi₂Te₃ polycrystals with different stoichiometry (60.0 and 62.8 at. % Te, respectively) as a charge, and subsequent condensation on glass substrates at 500 K. The temperature dependences of the Hall coefficient Rн, electrical conductivity σ, and Hall charge carrier mobility μн of thin films were obtained in the range 77-300 K. It was found that the films had the same type of conductivity as the initial polycrystals in the entire temperature range studied and, like in the initial crystals, σ and μн decreased with increasing temperature. The exponents ν in the μн(T) dependences for the bulk polycrystals were larger than those for the films and increased with increasing d. In contrast to the p-type bulk polycrystals, Rн of the p-type films decreased under increasing temperature. In the n-type Bi₂Te₃, Rн decreased with temperature for both thin films and bulk crystals, however, the character of the Rн(T) dependences for the crystals and films differed. The decrease in Rн with temperature before the range of intrinsic conductivity in all thin films is attributed to the existence of donor and acceptor defect states.