Анализ влияния внешних электромагнитных полей на работоспособность полупроводниковых приборов
| dc.contributor.author | Кравченко, Владимир Иванович | ru |
| dc.contributor.author | Серков, Александр Анатольевич | ru |
| dc.contributor.author | Бреславец, Виталий Сергеевич | ru |
| dc.contributor.author | Яковенко, Игорь Владимирович | ru |
| dc.date.accessioned | 2016-01-11T08:52:25Z | |
| dc.date.available | 2016-01-11T08:52:25Z | |
| dc.date.issued | 2015 | |
| dc.description.abstract | The influence of pulsed electromagnetic radiation on electric radio apparatus is often accompanied by currents arching on inner current – conducting elements as well as by the distortion of their internal fields have been determined. The development of theory of interaction of microwave electromagnetic oscillations and charged particles in bounded plasma-like media and the study of kinetic and hydrodynamic beam instabilities in solid–like structures applied in the present microwave electronics is proposed. The power losses of the flow of charged particles caused by such an interaction due to excitation of surface polaritons in the semiconductor superstructure have been determined. A new mechanism of initiation of surface at uneven of the conducting solid bodies is proposed. | en |
| dc.identifier.citation | Анализ влияния внешних электромагнитных полей на работоспособность полупроводниковых приборов / В. И. Кравченко [и др.] // Вестник Нац. техн. ун-та "ХПИ" : сб. науч. тр. Темат. вып. : Техника и электрофизика высоких напряжений. – Харьков : НТУ "ХПИ". – 2015. – № 51 (1160). – С. 45-49. | ru |
| dc.identifier.uri | https://repository.kpi.kharkov.ua/handle/KhPI-Press/19105 | |
| dc.language.iso | ru | |
| dc.publisher | НТУ "ХПИ" | ru |
| dc.subject | oscillations | en |
| dc.subject | plasma | en |
| dc.subject | semiconductor superlattices | en |
| dc.subject | collisionless extinction | en |
| dc.title | Анализ влияния внешних электромагнитных полей на работоспособность полупроводниковых приборов | ru |
| dc.title.alternative | Analysis of the influence of external electromagnetic fields on the working capacity of semi-conductor devices | en |
| dc.type | Article | en |
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