Тестовое диагностирование одномерных однородных структур
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НТУ "ХПИ"
Abstract
The test method of one-dimensional iterative logic arrays (ILAs), composed of identical cells, are considered. The fault model assumed is that faults in single cell can change a cell behavior in any arbitrary way. The method is based on finding fundamental circles in automaton model of ILA cell. The complexity of the test procedure is derived.
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Тестовое диагностирование одномерных однородных структур / Л. В. Дербунович [и др.] // Вестник Нац. техн. ун-та "ХПИ" : сб. науч. тр. Темат. вып. : Автоматика и приборостроение. – Харьков : НТУ "ХПИ", 2008. – № 31. – С. 49-57.