Using computer vision and neural networks for defect detection in manufacturing
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National Technical University "Kharkiv Polytechnic Institute"
Abstract
The research explores the application of computer vision and neural networks for automated defect detection in manufacturing processes. Deep learning-based algorithms analyze visual data to identify defects, optimize quality control, and enhance production efficiency [1]. The study aims to reduce human error, increase detection accuracy, and minimize production losses.
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Sotnychenko V. Using computer vision and neural networks for defect detection in manufacturing [Electronic resours] / Viktor Sotnychenko ; research supervisor Igor Yakovenko ; lang. support supervisor Tetyana Sergeyeva // An Innovative Model of Research Projects Aimed at the Integration of Ukraine into the European Scientific Space : book of abstr. an Annual Intern. PhD Conf., April 24, 2025 / National Technical University "Kharkiv Polytechnic Institute". – Electronic text data. – Kharkiv : NTU "KhPI", 2025. – P. 250-252.
