Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics

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dc.contributor.authorArtyukov, I. A.en
dc.contributor.authorFeschenko, R. M.en
dc.contributor.authorVinogradov, A. V.en
dc.contributor.authorBugayev, Ye. A.en
dc.contributor.authorDevizenko, O. Y.en
dc.contributor.authorKondratenko, V. V.en
dc.contributor.authorKasyanov, Yu. S.en
dc.contributor.authorHatano, T.en
dc.contributor.authorYamamoto, M.en
dc.contributor.authorSaveliev, S. V.en
dc.date.accessioned2014-03-12T18:35:21Z
dc.date.available2014-03-12T18:35:21Z
dc.date.issued2010
dc.description.abstractThe high transparency of carbon-containing materials in the spectral region of “carbon window” (∼4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targetsen
dc.identifier.citationSoft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics / I. A. Artyukov [et al.] // Micron. – 2010. – Vol. 41. – p. 722-728.en
dc.identifier.urihttps://repository.kpi.kharkov.ua/handle/KhPI-Press/4713
dc.language.isoen
dc.publisherElsevier Ltden
dc.subjectsoft X-ray microscopyen
dc.subjectcarbon windowen
dc.subjectX-ray multilayer mirroren
dc.subjectlaser plasmaen
dc.titleSoft X-ray imaging of thick carbon-based materials using the normal incidence multilayer opticsen
dc.typeArticleen

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