Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
Дата
2010
ORCID
DOI
Науковий ступінь
Рівень дисертації
Шифр та назва спеціальності
Рада захисту
Установа захисту
Науковий керівник
Члени комітету
Назва журналу
Номер ISSN
Назва тому
Видавець
Elsevier Ltd
Анотація
The high transparency of carbon-containing materials in the spectral region of “carbon window” (∼4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets
Опис
Ключові слова
soft X-ray microscopy, carbon window, X-ray multilayer mirror, laser plasma
Бібліографічний опис
Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics / I. A. Artyukov [et al.] // Micron. – 2010. – Vol. 41. – p. 722-728.