X-ray Methods for analisis of condensed films
Loading...
Date
item.page.orcid
DOI
item.page.thesis.degree.name
item.page.thesis.degree.level
item.page.thesis.degree.discipline
item.page.thesis.degree.department
item.page.thesis.degree.grantor
item.page.thesis.degree.advisor
item.page.thesis.degree.committeeMember
Journal Title
Journal ISSN
Volume Title
Publisher
Національний технічний університет "Харківський політехнічний інститут"
Abstract
The monograph is devoted to X-ray methods for studying thin films. Thin films, coatings, thin-film layered systems are the basis of modern technologies of micro- and nanoelectronics, optoelectronics, X-ray optics and microscopy. The proposed monograph presents the most important results of studies of thin-film systems obtained using original X-ray methods. The monograph is recommended for teachers, graduate students and senior students of specialties related to solid state physics.
Description
Citation
Malykhin S. V. X-ray Methods for analisis of condensed films / Serhyi Malykhin, Igor Mikhailov, Svitlana Borisova // Transactions on Physics & Math in Engineering Science. Series A: Materials & Technology : coll. monograph / ed. by: Serhyi Malykhin. – Vol. 2. – Kharkiv : NTU “KhPI”, 2025. – 85 p.