X-ray Methods for analisis of condensed films

dc.contributor.author	Malykhin, S. V.
dc.contributor.author	Mikhailov, Igor
dc.contributor.author	Borisova, Svitlana
dc.date.accessioned	2025-04-21T11:49:18Z
dc.date.issued	2025
dc.description.abstract	The monograph is devoted to X-ray methods for studying thin films. Thin films, coatings, thin-film layered systems are the basis of modern technologies of micro- and nanoelectronics, optoelectronics, X-ray optics and microscopy. The proposed monograph presents the most important results of studies of thin-film systems obtained using original X-ray methods. The monograph is recommended for teachers, graduate students and senior students of specialties related to solid state physics.
dc.identifier.citation	Malykhin S. V. X-ray Methods for analisis of condensed films / Serhyi Malykhin, Igor Mikhailov, Svitlana Borisova // Transactions on Physics & Math in Engineering Science. Series A: Materials & Technology : coll. monograph / ed. by: Serhyi Malykhin. – Vol. 2. – Kharkiv : NTU “KhPI”, 2025. – 85 p.
dc.identifier.uri	https://repository.kpi.kharkov.ua/handle/KhPI-Press/88556
dc.language.iso	en
dc.publisher	Національний технічний університет "Харківський політехнічний інститут"
dc.subject	monograph
dc.subject	condensed films
dc.subject	X-ray methods
dc.subject	nanoelectronics
dc.subject	optoelectronics
dc.subject	X-ray optics
dc.title	X-ray Methods for analisis of condensed films
dc.type	Monograph

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