Кафедра "Фізика"

Постійне посилання колекціїhttps://repository.kpi.kharkov.ua/handle/KhPI-Press/7578

Офіційний сайт кафедри http://web.kpi.kharkov.ua/tef

Кафедра "Фізика" створена у 2016 році шляхом об'єднання кафедри "Загальна та експериментальна фізика" і кафедри "Теоретична та експериментальна фізика", заснованої в 1972 році. .

У 1885 р. для викладання в інституті курсу фізики на посаду ад’юнкт-професора був запрошений магістр фізики приват-доцент Харківського університету Олександр Костянтинович Погорілко. У різні роки на кафедрі працювали видатні вчені-фізики: Пільчиков Н. Д., Латишев Г. Д., Обреїмов І. В., Пінес Б. Я., Ландау Л. Д., Корсунський М. І., Веркин Б. І., Дмитренко І. М., Базакуца В. А., Кулик І. О., Янсон І. К., Басс Ф. Г. Гуревич Ю. Г., Косевич В. М., Кукушкін Л. С. та ін.

Кафедра входить до складу Навчально-наукового інституту комп'ютерного моделювання, прикладної фізики та математики Національного технічного університету "Харківський політехнічний інститут".

У складі науково-педагогічного колективу кафедри працюють: 2 доктора та 16 кандидатів фізико-математичних наук, 2 кандидата технічних наук, 1 кандидат педагогічних наук; 2 співробітника мають звання професора, 12 – доцента.

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2013 - 20206

Налаштування

Автор: search.filters.author.Rogacheva, E. I.Ключові слова: search.filters.subject.thin film

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Зараз показуємо 1 - 6 з 6
  • Ескіз
    Публікація
    Transport properties of the bismuth telluride thin films with different stoichiometry in the temperature range 77-300 K
    (Науково-технологічний комплекс "Інститут монокристалів", 2020) Rogacheva, E. I.; Novak, K. V.; Doroshenko, A. N.; Nashchekina, O. N.; Budnik, A. V.
    The objects of the present study are thin films with thicknesses d = 45-620 nm prepared by thermal evaporation in vacuum from a single source, using undoped p- and n-type Bi₂Te₃ polycrystals with different stoichiometry (60.0 and 62.8 at. % Te, respectively) as a charge, and subsequent condensation on glass substrates at 500 K. The temperature dependences of the Hall coefficient Rн, electrical conductivity σ, and Hall charge carrier mobility μн of thin films were obtained in the range 77-300 K. It was found that the films had the same type of conductivity as the initial polycrystals in the entire temperature range studied and, like in the initial crystals, σ and μн decreased with increasing temperature. The exponents ν in the μн(T) dependences for the bulk polycrystals were larger than those for the films and increased with increasing d. In contrast to the p-type bulk polycrystals, Rн of the p-type films decreased under increasing temperature. In the n-type Bi₂Te₃, Rн decreased with temperature for both thin films and bulk crystals, however, the character of the Rн(T) dependences for the crystals and films differed. The decrease in Rн with temperature before the range of intrinsic conductivity in all thin films is attributed to the existence of donor and acceptor defect states.
  • Ескіз
    Документ
    Structure of p-Bi₂Te₃ thin films prepared by single source thermal evaporation in vacuum
    (2015) Rogacheva, E. I.; Budnik, A. V.; Fedorov, A. G.; Krivonogov, A. S.; Mateychenko, P. V.
    The growth mechanism, microstructure, and crystal structure of thin Bi₂Te₃ films with thicknesses d = 28 - 620 nm prepared by thermal evaporation of stoichiometric Bi₂Te₃ crystals in vacuum onto glass substrates were studied using X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy, and atomic force microscopy. The obtained thin films were polycrystalline, exhibited p-type conductivity and did not contain any other phases except for Bi₂Te₃. It was shown that with increasing film thickness, the crystallite size increased up to ~ 700-800 nm. It was established that the preferential orientation of crystallite growth was [00l] direction corresponding to a trigonal axis С3 in hexagonal lattice. When the film thickness exceeded ~ 200-250 nm, along with reflections from (00l) planes, reflections from other planes appeared, which indicated a certain disorientation of crystallites. The results obtained show that using a simple and inexpensive method of thermal evaporation from a single source and choosing optimal technological parameters, one can grow thin p-Bi₂Te₃ films of sufficiently high quality.
  • Ескіз
    Документ
    Size effects in lead telluride thin films and thermoelectric properties
    (Institute of Thermoelectricity, 2013) Olkhovskaya, S. I.; Rogacheva, E. I.
    The influence of thickness d on thermoelectric properties (the Seebeck coefficient S, electric conductivity σ, the Hall coefficient RH, charge carrier mobility μН) of films d = 8 – 170 nm in thickness, prepared by vacuum evaporation of PbTe crystals with lead excess onto (001) KCl substrates coated with Al2O3 layer has been studied. It has been established that films with d < 75 nm possess hole conductivity, and at d > 75 nm carrier transport is determined by n-type charge carriers. The inversion of conductivity sign close to d ≈ 75 nm is attributed to a change in thermodynamic equilibrium conditions in the films as compared to crystal, as well as to material evaporation and condensation features. Oscillations on the d-dependences of the kinetic coefficients of films with p-type conductivity are attributable to quantization of the hole gas of carriers. Calculation of oscillation period Δd using a model of infinitely deep rectangular potential well is in good agreement with the experimentally determined Δd value. For n-type conductivity films the values of kinetic coefficients increase with increase in d, which points to manifestation of a classical size effect.
  • Ескіз
    Документ
    Dependences of thermoelectric properties on the thickness of thin films of indium doped lead telluride
    (Institute of Thermoelectricity, 2014) Menshikova, S. I.; Rogacheva, E. I.; Sipatov, A. Yu.; Matychenko, P. V.; Dobrotvorskaya, M. V.
    Dependences of thermoelectric properties (the Seebeck coefficient S, the electric conductivity σ, the Hall coefficient RH, the carrier mobilityμ and the thermoelectric power P = S²·σ) on the thickness d (d = 10 – 255 nm) of thin films prepared by vacuum evaporation of indiumdoped PbTe crystals and subsequent condensation on (111) BaF₂ substrates were obtained. With decreasing thickness of films to d ≈ 40 nm, there is n- to p-type inversion of conduction which is related to a change in thermodynamic equilibrium conditions and partial reevaporation of lead and/or indium atoms. Extremes were found on the thickness dependences of properties at d₁ ≈ 20 nm which is indicative of hole gas quantization. In the range of thicknesses with n-type conduction there is a smooth change in thermoelectric properties with thickness which testifies to manifestation of classical size effect and is sufficiently well described in the framework of the Fuchs-Sondheimer theory.
  • Ескіз
    Документ
    Size effects in thin n-PbTe films
    (STC "Institute for Single Crystals", 2015) Menshikova, S. I.; Rogacheva, E. I.; Sipatov, A. Yu.; Zubarev, Evgeniy N.
  • Ескіз
    Документ
    Size effects in chlorine doped PbSe thin films
    (Institute of Thermoelectricity, 2015) Menshikova, S. I.; Rogacheva, E. I.; Sipatov, A. Yu.; Krivonogov, S. I.; Matychenko, P. V.
    The possibility of obtaining strongly degenerate (≈ 3·10²⁰ сm⁻³) PbSe thin films (d = 5 – 220 nm) with n-type conductivity by thermal evaporation in vacuum of PbSe crystals doped with PbCl₂, with subsequent condensation onto (001) KCl substrates was established. It was shown that the films had high homogeneity degree, no grain structure was observed. The thickness dependences of thermoelectric properties (the Seebeck coefficient S, the Hall coefficient RH and the electric conductivity σ) of thin films were obtained. In the thickness range d ≈ 5 ÷ 30 nm, oscillation properties were observed with growth of d that are attributable to electron gas quantization. The calculation of S(d) dependence on the assumption of size quantization with regard to contribution of several subbands and the thickness dependence of the Fermi energy was shown to be in agreement with the experimental data. In the region of d > 30 nm there was growth of S and σ with thickness, which is attributable to manifestation of classical size effect and interpreted in the framework of Fuchs-Sondheimer and Mayer theories.