Кафедра "Фізика металів і напівпровідників"

Постійне посилання колекціїhttps://repository.kpi.kharkov.ua/handle/KhPI-Press/4703

Офіційний сайт кафедри http://web.kpi.kharkov.ua/fmp

Від 2002 року кафедра має назву "Фізика металів і напівпровідників", попередня назва – кафедра металофізики.

Кафедра металофізики організована в 1930 році у складі фізико-механічного факультету ХММІ. Деканом факультету був у ті роки видатний вчений-фізик, академік Іван Васильович Обреїмов.

Кафедра входить до складу Навчально-наукового інституту комп'ютерного моделювання, прикладної фізики та математики Національного технічного університету "Харківський політехнічний інститут". За час існування кафедрою підготовлено близько 3000 інженерів, у тому числі і для зарубіжних країн.

У складі науково-педагогічного колективу кафедри працюють: 3 доктора та 2 кандидата фізико-математичних наук; 3 співробітника мають звання професора.

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Зараз показуємо 1 - 10 з 11

Kinetics of phase transitions in highly oriented graphite intercalated with potassium
(STC "Institute for Single Crystals", 2020) Mikhailov, I. F.; Zubarev, Evgeniy N.; Mikhailov, A. I.; Mamon, V. V.; Borisova, S. S.; Surovitskiy, S. V.
Alloying and modification of stainless steels by powerful plasma streams
(Національний науковий центр "Харківський фізико-технічний інститут", 2016) Makhlaj, V. A.; Aksenov, N. N.; Byrka, O. V.; Chunadra, A. G.; Herashchenko, S. S.; Malykhin, S. V.; Mikhailov, I. F.; Sereda, K. N.; Surovitskiy, S. V.; Garkusha, I. E.
Alloying and modification of stainless steels by powerful plasma streams
(2016) Makhlaj, V. A.; Aksenov, N. N.; Byrka, O. V.; Chunadra, A. G.; Herashchenko, S. S.; Malykhin, S. V.; Mikhailov, I. F.; Sereda, K. N.; Surovitskiy, S. V.
The stainless steel surfaces coated of tungsten have been alloyed and modified with powerful QSPA Kh-50 plasma streams. The plasma streams exposures result in modification of steel-based materials and formation of re-solidified layers. The changes of substrate texture were also registered. Phase characterized by body-centered cubic lattice appeared due to recrystallization of affected material. Thus, the favorable conditions were created for penetration of tungsten into the stainless steel bulk. Growth of lattice parameter was observed as result of plasma irradiation of coated samples. It's indication of tungsten penetration into the depth of substrates.
Structure and phase formation features of Ti-Zr-Ni quasicrystalline films under heating
(Sumy State University, 2019) Malykhin, S. V.; Kondratenko, V. V.; Kopylets, I. A. ; Surovitskiy, S. V.; Baturin, A. A.; Mikhailov, I. F.; Reshetnyak, M. V.; Borisova, S. S.; Bogdanov, Yu. S.
The paper describes the growth features of thin Ti-Zr-Ni films prepared by the method of magnetron sputtering of the targets with compositions Ti₅₃Zr₃₀Ni₁₈ and Ti₄₁Zr₃₈.₃Ni₂₀.₇ on the substrates at 300 K with subsequent annealing in vacuum. The formation peculiarities of phase composition, structure and thermal stability of quasicrystalline thin films were studied. It was established that in initial state the films were X-ray-amorphous or nanocrystalline with coherence lengths (according to Scherrer) near 1.6-1.8 nm independently on the element composition of the sputtered target. This structure is relatively stable up to the temperature 673 K when the formation of the quasi-crystalline phase begins. In the films with composition of Ti₅₃Zr₃₀Ni₁₈. It is added with an admixture of the 1/1 W-crystal approximant phase. In the films with Ti₄₁Zr₃₈.₃Ni₂₀.₇ composition, an optimal annealing temperature is between 823 K and 873 K. Additionally, for the first time, the data on the formation of 2/1 approximant crystal as an admixture phase in this system were obtained. Under annealing at the temperatures higher than 873 K, the decomposition of the quasi-crystalline and approximant phases into crystalline phases stable at higher temperatures according to the equilibrium phase diagram was established.
Features of the initial stage of the formation of Ti-Zr-Ni quasicrystalline thin films
(Sumy State University, 2020) Malykhin, S. V.; Kondratenko, V. V.; Kopylets, I. A. ; Surovitskiy, S. V.; Shipkova, I. G.; Mikhailov, I. F.; Zubarev, Evgeniy N.; Bogdanov, Yu. S.
Using the methods of X-ray diffraction, transmission and scanning microscopy, the features of the initial stage of the formation of the quasicrystalline phase in thin films of Ti-Zr-Ni are studied. The films were obtained by magnetron sputtering of a target of the composition Ti₄₁Zr₃₈.₃Ni₂₀,₇ (at. %) with deposition on substrates at T = 300 K and further vacuum annealing. It was established that immediately after deposition, the films are X-ray amorphous, nanostructured. An analysis of the radial distribution functions shows that immediately after deposition, the structural state of a disordered cluster, which is topologically close to icosahedral, prevails in the near atomic medium. It is concluded that the atoms are not arranged randomly, but form a "transitional" structure with an imperfect order like three shells of the Bergman cluster stacking using icosahedrons and dodecahedrons. Such a structure is a "prepared" nucleus for the further formation of the icosahedral phase upon heating. An analysis of the annealing results suggests that the qualitative nature of the transition from the pseudo-amorphous to the quasicrystalline phase and the scale of the transformations are determined by the annealing time and temperature, as well as by the film thickness. The smaller the thickness, the more the annealing processes are inhibited. It was shown that by annealing the films of a thickness of 6 μm or more at 500 °C for more than 28 h, single-phase quasicrystalline coatings with a quasicrystallinity parameter aq of about 0.5245 nm can be obtained.
Structure of magnetron hydroxyapatite films with small stoichiometry deviation
(STC "Institute for Single Crystals", 2016) Mikhailov, I. F.; Starikov, V. V.; Baturin, A. A.
Phase composition, coherence lengths and micro-strain level in hydroxyapatite films with controlled deviation from stoichiometry (Ca/P = 1.67) were measured by methods of X-ray diffraction and X-ray fluorescent analysis. It was established that at Ca/P = 1.6±0.03, hydroxyapatite layers with thickness 2m on the niobium substrates were practically single-phase but differed by the coherence lengths and micro-strain levels for different crystallographic directions: the coherence length along was commensurable with the film thickness and much exceeded the values for and directions. The micro-strain level ε for direction reached (1.3÷1.7)·10-3 being by an order higher than for and directions. That testifies constrained growth conditions along with the high homogeneity of the lattice period of the hydroxyapatite film.
X-Ray Fluorescence Determination of Trace Gold in an Ion-Exchange Resin
(Pleiades Publishing, Ltd., 2014) Mikhailov, I. F.; Baturin, A. A.; Mikhailov, A. I.; Fomina, L. P.
The use of portable X ray optics with a secondary radiator in the determination of trace gold in an ion exchange resin within the mass fraction range of 1–50 ppm is described. It is shown that the secondary radiator design with primary radiation filtering allows one to determine trace gold in an ion exchange resin when the mass fraction of gold is lower than 1 ppm.
X-ray method for determination of mineral constituent in solid fuel
(Scientific and Technological Corporation "Institute for Single Crystals", 2014) Mikhailov, I. F.; Baturin, A. A.; Mikhailov, A. I.
Запропоновано рентгенівський метод визначення мінеральної складової твердого пального за співвідношенням інтенсивності піків комптонівського та релєївського розсіяння.
High-Stable Standard Samples of Mass in the Nano-Gram Range
(Scientific and Technological Corporation "Institute for Single Crystals", 2013) Mikhailov, I. F.; Baturin, A. A.; Bugaev, Ye. A.; Mikhailov, A. I.; Borisova, S. S.
Исследованы высокостабильные эталоны масс, полученные методом магнетронного осаждения сверхгладких слоев металлов на монокристаллические подложки. Тонкопленочные эталоны отвечают требованиям, предъявляемым ГОСТ 8.315-97 к государственным стандартным образцам: однородны, стабильны во времени и допускают аттестацию несколькими независимыми методами. Обеспечена точность измерений массы в диапазоне от 1 до 17 нг не хуже 1 нг, а в диапазоне от 17 до 3800 нг не хуже 8 нг.
Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
(Scientific and Technological Corporation "Institute for Single Crystals", 2012) Mikhailov, I. F.; Baturin, A. A.; Mikhailov, A. I.; Borisova, S. S.
Проведена оптимизация толщины первичного фильтра в схеме флуоресцентного переизлучателя по критерию наименьшего предела обнаружения Сmin. Экспериментально установлено, что фильтрация обеспечивает трех-четырех кратное повышение контрастности и 70 %-й выигрыш в пределе обнаружения по критерию Сmin. Для следовых примесей золота в ионообменных смолах достигнутая чувствительность анализа на уровне 1 ppm не уступает реализуемой в сложной схеме Баркла с поляризованным излучением.