Кафедра "Фізика металів і напівпровідників"

Постійне посилання колекціїhttps://repository.kpi.kharkov.ua/handle/KhPI-Press/4703

Офіційний сайт кафедри http://web.kpi.kharkov.ua/fmp

Від 2082 року кафедра має назву "Фізика металів і напівпровідників", попередня назва – кафедра металофізики.

Кафедра металофізики організована в 1930 році у складі фізико-механічного факультету ХММІ. Деканом факультету був у ті роки видатний вчений-фізик, академік Іван Васильович Обреїмов.

Кафедра входить до складу Навчально-наукового інституту комп'ютерного моделювання, прикладної фізики та математики Національного технічного університету "Харківський політехнічний інститут". За час існування кафедрою підготовлено близько 3000 інженерів, у тому числі і для зарубіжних країн.

У складі науково-педагогічного колективу кафедри працюють: 3 доктора та 2 кандидата фізико-математичних наук; 3 співробітника мають звання професора.

Переглянути

Фільтри

2018 - 20203

Налаштування

Тип документа: search.filters.entityType.Publication

Результати пошуку

Зараз показуємо 1 - 3 з 3
  • Ескіз
    Публікація
    Size effects and thermoelectric properties of Bi0.98Sb0.02 thin films
    (Institute of Thermoelectricity National Academy of Sciences of Ukraine, 2020) Rogacheva, E. I.; Novak, K. V.; Orlova, D. S.; Nashchekina, O. N.; Sipatov, A. Yu.; Lisachuk, G. V.
    The room-temperature dependences of thermoelectric properties (the Seebeck coefficient S, the electrical conductivity σ, the Hall coefficient RH, and the thermoelectric power factor P = S2·σ) on the thickness (d = 5 - 250 nm) of the Bi0.98Sb0.02 solid solution thin films grown on mica substrates by thermal evaporation in vacuum from a single source were obtained. It is shown that the monotonic component of the σ(d) dependence is well described within the framework of the Fuchs-Sondheimer theory for the classical size effect. The presence of an oscillating component in the d-dependences of σ, S, RH and S2·σ is attributed to the manifestation of the quantum size effect, and the experimentally determined period of quantum oscillations Δd = 45 ± 5 nm is in good agreement with the Δd value calculated theoretically within the framework of the model of an infinitely deep potential well. Bibl. 77, Fig. 1.
  • Ескіз
    Публікація
    Thickness-dependent quantum oscillations of the transport properties in bismuth selenide thin films
    (Elsevier, 2019) Rogacheva, E. I.; Menshikova, S. I.; Sipatov, A. Yu.; Nashchekina, O. N.
    The objects of the present study were thin n-Bi2Se3 films with thicknesses d = 10–100 nm, grown by thermal evaporation of n-Bi2Se3 crystals in vacuum onto heated glass substrates. The room temperature d-dependences of the Seebeck coefficient, the Hall coefficient, and the electrical conductivity of the films exhibited an oscillatory behavior, which we attribute to quantum size effects. Such interpretation of the results is supported by the fact that experimentally determined values of the oscillation period are in quite good agreement with the theoretically calculated ones. We suggest that the large amplitude and undamped character of the oscillations in the studied range of thicknesses are connected with the topologically protected gapless surface states of Bi2Se3. The observed oscillatory character of the d-dependences of the transport coefficients should be taken into account when 2D-structures are applied in nanothermoelectricity and other fields of nanoscience and nanotechnology.
  • Ескіз
    Публікація
    Structure of thermally evaporated bismuth selenide thin films
    (Науково-технологічний комплекс "Інститут монокристалів", 2018) Rogacheva, E. I.; Fedorov, A. G.; Krivonogov, S. I.; Mateychenko, P. V.; Dobrotvorskay, M. V.; Garbuz, A. S.; Nashchekina, O. N.; Sipatov, A. Yu.
    The Bi₂Se₃ thin films with thicknesses d = 7-420 nm were grown by thermal evaporation in vacuum of stoichiometric n-Bi₂Se₃ crystals onto heated glass substrates under optimal technological conditions determined by the authors. The growth mechanism, microstructure, and crystal structure of the prepared thin films were studied using X-ray diffraction, scanning electron microscopy, energy-dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy, and atomic force microscopy. It was established that the prepared thin films were polycrystalline, with composition close to the stoichiometric one, did not contain any phases apart from Bi₂Se₃, were of a high structural quality, and the preferential growth direction [001] corresponded to the direction of a trigonal axis C₃ in a hexagonal lattice. The films, like the initial crystal, exhibited n-type conductivity. It was shown that with increasing film thickness, the grain size and the film roughness remain practically the same at thicknesses d < 100 nm, and after that increase, reaching their saturation values at d ~ 300 nm. It follows from the results obtained in this work that using the method of thermal evaporation in vacuum from a single source, one can prepare thin n-Bi₂Se₃ films of a sufficiently high structural quality with a composition close to the stoichiometric one and the preferential growth orientation.