Cryogenic spectrometric ellipsometer for studding solid state optical properties

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dc.contributor.authorBelyaeva, A. I.
dc.contributor.authorGrebennik, T. G.
dc.date.accessioned2025-10-16T08:57:27Z
dc.date.issued1997
dc.description.abstractCryogenic spectrometric ellipsometer (CSE) for studding solid state optical properties was developed. CSE permits determination of the optical constants of solid in the range between 0,3 and 2 micron,in temperature interval from 5 up to 300K. CSE is used for bulk samples characterization and thin films including multilayers stacks analysis (refractive indices and absorption coefficients ( pseudodielectric functions ) and thickness measurement). The special small continuous flow cryostat had been designed for studies in the wide temperature range.The angles of incidence are changed from 45 to 700 discretely by the position of the cryostat windows.
dc.identifier.citationBelyaeva A. I. Cryogenic spectrometric ellipsometer for studding solid state optical properties / Alla I. Belyaeva, T. G. Grebennik // Proceedings of SPIE. 1997. — Vol. 3359 : Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998). — Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine. — P. 401–407. — URL: https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3359/1/Cryogenic-spectrometric-ellipsometer-for-studying-solid-state-optical-properties/10.1117/12.306252.full.
dc.identifier.doihttps://doi.org/10.1117/12.306252
dc.identifier.urihttps://repository.kpi.kharkov.ua/handle/KhPI-Press/94110
dc.language.isoen
dc.publisherSPIE
dc.subjectcryogenics spectrometric ellipsometer
dc.subjectoptical properties
dc.subjectmultilayers
dc.subjectcontinuous flow cryostat
dc.subjectspectroscopy
dc.subjecttemperature metrology
dc.subjectrefractive index
dc.subjectsolid state physics
dc.titleCryogenic spectrometric ellipsometer for studding solid state optical properties
dc.typeArticle

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