Crystal Structure of Nanoscale Tin Dioxide Films Produced by Magnetron Sputtering

dc.contributor.authorSokol, Yevgen I. en
dc.contributor.authorPirohov, O. V.en
dc.contributor.authorKlochko, N. P.en
dc.contributor.authorNovikov, V. A.en
dc.contributor.authorKhrypunov, G. S.en
dc.contributor.authorKlepikova, K. S.en
dc.date.accessioned2017-11-02T09:58:42Z
dc.date.available2017-11-02T09:58:42Z
dc.date.issued2014
dc.description.abstractInvestigation of direct current magnetron sputtering parameters effects on the crystal structure of gas sensitive tin dioxide films has revealed that the change in the substrate temperature and in the film thickness leads to the transition from the condensation of metastable conglomerates of amorphous globules to the ≈15 nm SnO₂ crystallites with three-dimensional shape and well-defined edges. The dependence of the SnO₂ structure from the working Ar-O₂ gas mixtures and from their humidity evidences the significant role of the adsorption in the kinetics of the magnetron sputtering of tin dioxide. Due to the adsorption the morphological and dimensional characteristics of the tin dioxide films demonstrate the anomalous stability of the amorphous globules with their enhanced specific surface energy and the stabilization of the amorphous state, selectively retained even after the SnO₂ film reach in general the critical thickness of the crystallization.en
dc.identifier.citationCrystal Structure of Nanoscale Tin Dioxide Films Produced by Magnetron Sputtering / E. I. Sokol [et al.] // IEEE 34th International Conference on Electronics and Nanotechnology ELNANO-2014, April 15-18, 2014, Kyiv. – Kyiv : KPI, 2014. – p. 27-30.en
dc.identifier.urihttps://repository.kpi.kharkov.ua/handle/KhPI-Press/32423
dc.language.isoen
dc.publisherKyiv polytechnic instituteen
dc.subjecttin dioxideen
dc.subjectcrystal structureen
dc.subjectgas sensoren
dc.subjectelectron microscopyen
dc.titleCrystal Structure of Nanoscale Tin Dioxide Films Produced by Magnetron Sputteringen
dc.typeArticleen

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