"In-Situ" Electron Microscopy Video Registration of Thin Amorphous Films Crystallization

dc.contributor.authorBagmut, A. G.en
dc.date.accessioned2022-06-06T17:18:22Z
dc.date.available2022-06-06T17:18:22Z
dc.date.issued2020
dc.description.abstractThe article summarizes the results of electron microscopic studies of "in situ" crystallization of thin amorphous films. Data analysis is carried out based on the classification scheme of electron-beam crystallization of films, including structural-morphological and numerical characteristics. Layer polymorphous crystallization (as the analogue of Frank–van der Merwe growth mode), island polymorphous crystallization (as an analogue of the Volmer–Weber growth mode) and dendrite polymorphous crystallization (as an analogue of the Stransky–Krastanov growth mode) are identified. For each type of crystallization a dimensionless parameter of the relative length δ₀ is determined. It is equal to the ratio of the characteristic length to the value, related to the size of the unit cell of the crystal. Based on the electron microscopic video registration of the process, kinetic crystallization curves are built for each type of the transformation.en
dc.identifier.citationBagmut A. G. "In-Situ" Electron Microscopy Video Registration of Thin Amorphous Films Crystallization / A. G. Bagmut // Metallophysics and advanced technologies = Металофізика і новітні технології. – 2020. – Vol. 42, No. 8. – P. 1065-1078.en
dc.identifier.doidoi.org/10.15407/mfint.42.08.1065
dc.identifier.orcidhttps://orcid.org/0000-0001-5286-0617
dc.identifier.urihttps://repository.kpi.kharkov.ua/handle/KhPI-Press/57099
dc.language.isoen
dc.publisherІнститут металофізики ім. Г. В. Курдюмова НАН Україниuk
dc.publisherАкадемперіодикаuk
dc.subjectcrystallization kineticsen
dc.subjectcrystal growth modesen
dc.subjectTEMen
dc.subjectamorphous filmsen
dc.subjectrelative lengthen
dc.subjectvideo registrationen
dc.title"In-Situ" Electron Microscopy Video Registration of Thin Amorphous Films Crystallizationen
dc.typeArticleen

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