Optical detection of radiation-induced defect phase formation in solid XE
dc.contributor.author | Ogurtsov, A. N. | en |
dc.contributor.author | Bliznjuk, O. N. | en |
dc.contributor.author | Kleshchev, N. F. | en |
dc.contributor.author | Masalitina, N. Yu. | en |
dc.date.accessioned | 2021-01-22T11:07:33Z | |
dc.date.available | 2021-01-22T11:07:33Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | Optical detection of radiation-induced defect phase formation in solid XE [Electronic resource] / A. N. Ogurtsov [et al.] // Optical materials (OM7) : book of abstr. of the 7th Intern. symp., February 29-March 4, 2016. – Electronic text data. – Lyon, France, 2016. – 1 p. – URI: http://repository.kpi.kharkov.ua/handle/KhPI-Press/50488. | en |
dc.identifier.orcid | https://orcid.org/0000-0003-4688-6428 | |
dc.identifier.orcid | https://orcid.org/0000-0003-1454-1038 | |
dc.identifier.orcid | https://orcid.org/0000-0001-7347-2584 | |
dc.identifier.uri | https://repository.kpi.kharkov.ua/handle/KhPI-Press/50488 | |
dc.language.iso | en | |
dc.subject | frenkel pairs | en |
dc.subject | defect formation | en |
dc.subject | self-trapped excitons | en |
dc.subject | aggregation of defects | en |
dc.title | Optical detection of radiation-induced defect phase formation in solid XE | en |
dc.type | Thesis | en |
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