Кафедра "Комп'ютерна математика і аналіз даних"

Постійне посилання колекціїhttps://repository.kpi.kharkov.ua/handle/KhPI-Press/7570

Офіційний сайт кафедри http://web.kpi.kharkov.ua/kmmm

Кафедра "Комп'ютерна математика і аналіз даних" заснована в 2002 році.

Кафедра входить до складу Навчально-наукового інституту комп'ютерних наук та інформаційних технологій Національного технічного університету "Харківський політехнічний інститут", забезпечує підготовку бакалаврів і магістрів за проектно-орієнтованою освітньою програмою за напрямом науки про дані "DataScience".

У складі науково-педагогічного колективу кафедри працюють: 3 доктора наук: 1 – технічних, 1 – фізико-математичних, 1 – педагогічних; 15 кандидатів наук: 10 – технічних, 4 – фізико-математичних, 1 – педагогічних; 3 співробітників мають звання професора, 9 – доцента.

Переглянути

Результати пошуку

Зараз показуємо 1 - 6 з 6

The optical characteristics of contaminating films on Mo, SS and Cu mirror samples exposed in plasma devices
(National Science Center "Kharkov Institute of Physics and Technology", 2008) Bondarenko, V. N.; Belyaeva, A. I.; Galuza, A. A.; Konovalov, V. G.; Kudlenko, A. D.; Ryzhkov, I. V.; Shtan, A. F.; Solodovchenko, S. I.; Voitsenya, V. S.
The optical methods with the use of in-vessel first mirrors (FMs) are expected to occupy an important place in the diagnostic complex of the future fusion reactor ITER. As the surface of FMs will be subjected to physical sputtering by high-energy D and T charge-exchange atoms, this can lead to a decline in the initial FM reflectance. The second factor of FM reflectance deterioration is the redeposition of contaminants on the mirror surface. In the paper, optical indices and thickness values of the films deposited on Mo and SS mirrors in the tokamak TRIAM-1M as well as on SS and Cu mirrors in the torsatron URAGAN-3M were studied by ellipsometry at the wavelength λ=632.8 nm. The spectral reflectance at normal incidence of light for all the samples was measured in the wavelength range λ=253–650 nm. The optical parameters of TRIAM-1M films were determined as the film was progressively removed by deuterium plasma ions in the stand DSM-2.
Surface energy anisotropy for the low-index crystal surfaces of the textured polycrystalline BCC tungsten: experimental and theoretical analysis
(National Science Center "Kharkov Institute of Physics and Technology", 2017) Belyaeva, A. I.; Savchenko, A. A.; Galuza, A. A.; Kolenov, I. V.
Summarizing the experimental and theoretical trends observed on the changes in surface microstructure and topography resulting from surface energy anisotropy for the low-index crystal surfaces of the polycrystalline bcc tungsten under sputtering is done. A brief summary of the most closely related work is included. The experimental results have been discussed in the framework of the various theoretical methods. Emphasis was placed on the problems which are existing up to now. It is shown that the absence of a common trend in the ordering of the (100), (110), and (111) surface energies amongst the various theoretical models is a problem yet to be satisfactorily discussed. It is shown experimentally that for polycrystalline textured tungsten (bcc metal), the order of the three low-index surface energies is γ(111) > γ(100) > γ(110).
Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study
(Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 1999) Belyaeva, A. I.; Galuza, A. A.; Grebennik, T. G.; Yuriyev, V. P.
A multiple angle ellipsometric method is used for measurements of thin film layers on substrates. The method evaluates fundamental optical constants and thicknesses of the film layers. Dielectric func tions of the surface layers on the gadolinium gallium garnet (GdGaG) substrate – commonly used substrate material for rare-earth ferrogarnets (ReFeG) films, have been determined. The thickness and origin of the surface layer on the GdGaG substrate was found out. It is shown that the dielectric properties of microscopically rough layers with thicknesses ~ of 20 to 35 nm can be accurately modeled in the homogeneous thin layer approximation, but not in the effective-medium one. The precision of data was confirmed by comparing different simulations. Agreement to the third decimal point for refraction index was shown. Errors for thicknesses were not more than 3%.
Influence of the parallelepiped form localized defects on ellipsometry data: scale modeling
(Institute of Nuclear Physics Polish Academy of Sciences, 2021) Galuza, A. A.; Kolenov, I.; Savchenko, A.
Influence of the parallelepiped form localized defects on ellipsometry data: scale modeling
(Institute of Nuclear Physics, 2021) Galuza, A. A.; Kolenov, I.; Savchenko, Alla Aleksandrovna
Ця стаття присвячена проблемі аналізу еліпсометричних даних поверхні з локалізованими дефектами (різні фази, пухирі, зерна тощо).
Effect of deformation degree under quasihydroextrusion at 77K on the structure and properties of CuCrZr alloy
(Харківський національний університет імені В. Н. Каразіна, 2019) Belyaeva, A. I.; Khaimovich, P. A.; Galuza, A. A.; Kolenov, I. V.; Savchenko, Alla Aleksandrovna; Shul`gin, N. A.